@inproceedings{2f68957d77b3464ebadcfd0bcebdb847,
title = "Assessing the Significance of Electro-Thermal Stress on Varistor Arresters Using Kruskal-Wallis H-Test",
abstract = "In this study, the effect of electro-thermal stresses on the microstructure of low-voltage zinc oxide varistors is experimentally investigated. Accelerated ageing tests, based on continuous ac voltage stress at several thermal points, are conducted prior to linear intercept on scanning electro microscopy-based micrographs. The Kruskal-Wallis H-test is used to assess the extent of microstructural changes in the tested varistor arresters. Results obtained show significant change in the microstructure of the varistor arresters as a result of electro-thermal treatment.",
keywords = "aging, EDS, Kruskal-Wallis H-test, SEM, thermal stresses, Zinc Oxide microstructure",
author = "L. Muremi and P. Bokoro",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018 ; Conference date: 12-06-2018 Through 15-06-2018",
year = "2018",
month = oct,
day = "16",
doi = "10.1109/EEEIC.2018.8494442",
language = "English",
series = "Proceedings - 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018",
address = "United States",
}