@inproceedings{5e1d58d7e4564449bb8171d4488d5e21,
title = "Assessing the impact of field intensity on the performance reliability of varistor arresters",
abstract = "In this paper, the effect of the intensity of continuously-applied ac field stress on the performance reliability of varistor arresters is investigated. Accelerated degradation test is conducted for 48 hours at constant temperature of 135°C for sixty similar varistor samples. Three magnitudes of the ac voltage are used as typical bias voltage points for the varistor samples involved in this work. The times to failure data obtained during the experiment are tested for conformity to the two-parameter Weibull statistical distribution, before the shape and scale parameters are determined. Results show that for a constant temperature, high performance reliability of varistor arresters proves to be consistent with low intensity of bias voltage point.",
keywords = "accelerated degradation, bias voltage, Field intensity, metal oxide varistor, reliability, weibull distribution",
author = "Mulalo Marwala and Pitshou Bokoro",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE AFRICON, AFRICON 2019 ; Conference date: 25-09-2019 Through 27-09-2019",
year = "2019",
month = sep,
doi = "10.1109/AFRICON46755.2019.9133877",
language = "English",
series = "IEEE AFRICON Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "IEEE AFRICON 2019",
address = "United States",
}