Assessing the correlation between impedance and reference voltage of varistor arresters using linear regression model

Lutendo Muremi, Pitshou Bokoro

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper assesses the correlation between impedance and reference voltage of degraded metal oxide varistors. Low-voltage varistor devices are artificially degraded using switching impulse currents and thermal stresses. Impedance and reference voltage are measured before and after degradation tests. Linear regression is applied in order to model the relationship between observed changes in varistor impedance and reference voltage. The validity of the obtained model is subsequently verified using analysis of variance. Results show no linear relationship between varistor impedance decrease and reference voltage.

Original languageEnglish
Title of host publicationProceedings
Subtitle of host publicationIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages109-113
Number of pages5
ISBN (Electronic)9781509066841
DOIs
Publication statusPublished - 26 Dec 2018
Event44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018 - Washington, United States
Duration: 20 Oct 201823 Oct 2018

Publication series

NameProceedings: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

Conference

Conference44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018
Country/TerritoryUnited States
CityWashington
Period20/10/1823/10/18

Keywords

  • Analysis of variance
  • Degradation
  • Impedance
  • Linear regression
  • Metal oxide varistor
  • Reference voltage

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Control and Optimization

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