@inproceedings{eacaa867ca4148bf84cdc289a23aee44,
title = "Assessing the correlation between impedance and reference voltage of varistor arresters using linear regression model",
abstract = "This paper assesses the correlation between impedance and reference voltage of degraded metal oxide varistors. Low-voltage varistor devices are artificially degraded using switching impulse currents and thermal stresses. Impedance and reference voltage are measured before and after degradation tests. Linear regression is applied in order to model the relationship between observed changes in varistor impedance and reference voltage. The validity of the obtained model is subsequently verified using analysis of variance. Results show no linear relationship between varistor impedance decrease and reference voltage.",
keywords = "Analysis of variance, Degradation, Impedance, Linear regression, Metal oxide varistor, Reference voltage",
author = "Lutendo Muremi and Pitshou Bokoro",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018 ; Conference date: 20-10-2018 Through 23-10-2018",
year = "2018",
month = dec,
day = "26",
doi = "10.1109/IECON.2018.8591810",
language = "English",
series = "Proceedings: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "109--113",
booktitle = "Proceedings",
address = "United States",
}