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Applications of AES, XPS and TOF SIMS to phosphor materials
H. C. Swart
, J. J. Terblans
, O. M. Ntwaeaborwa
, R. E. Kroon
, E. Coetsee
, I. M. Nagpure
, Vijay Kumar
, Vinod Kumar
, Vinay Kumar
University of The Free State
Shri Mata Vaishno Devi University
Research output
:
Contribution to journal
›
Article
›
peer-review
15
Citations (Scopus)
Overview
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Material Science
Auger Electron Spectroscopy
100%
Secondary Ion Mass Spectrometry
100%
X-Ray Photoelectron Spectroscopy
100%
Doping (Additives)
33%
Surface Reaction
33%
Engineering
Ray Photoelectron Spectroscopy
100%
Time-of-Flight
66%
Dopants
33%
Elemental Composition
33%
Electron Bombardment
33%
Keyphrases
Phosphor Materials
100%
Chemical Valence
33%