Annealing studies on the heavy-fermion materials CeM2Sn2

  • P. de
  • , A. Baran
  • , T. Germishuyse
  • , R. P. Gers
  • , C. Esterhuyse
  • , J. L. van Heerden
  • , P. J. van Greunen
  • , A. M. Strydom

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

Electrical resistivity measurements are presented on CeM2Sn2 compounds (M = Ni, Cu, Pd, Pt) subjected to different annealing procedures after being prepared by arc-melting. Large changes in the temperature dependence of the resistivity are observed following annealing. Results of X-ray diffraction are also presented.

Original languageEnglish
Pages (from-to)487-490
Number of pages4
JournalPhysica B: Condensed Matter
Volume186-188
Issue numberC
DOIs
Publication statusPublished - 2 May 1993
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Annealing studies on the heavy-fermion materials CeM2Sn2'. Together they form a unique fingerprint.

Cite this