Abstract
Electrical resistivity measurements are presented on CeM2Sn2 compounds (M = Ni, Cu, Pd, Pt) subjected to different annealing procedures after being prepared by arc-melting. Large changes in the temperature dependence of the resistivity are observed following annealing. Results of X-ray diffraction are also presented.
Original language | English |
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Pages (from-to) | 487-490 |
Number of pages | 4 |
Journal | Physica B: Condensed Matter |
Volume | 186-188 |
Issue number | C |
DOIs | |
Publication status | Published - 2 May 1993 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering