Abstract
Embedded temperature sensors based on proportional-to-the-absolute- temperature (PTAT) current sources have the potential to lay the foundation for low-cost temperature-aware integrated circuit architectures if they meet the requirements of miniaturization, fabrication process match, and precise estimation in a wide range of temperatures. This paper addresses an analytical approach to the minimum-element PTAT circuit design capitalizing on the physics-based modeling of the heterojunction bipolar transistor (HBT) structures. It is shown that a PTAT circuit can be implemented on only two core HBT elements with good accuracy. Derived parametric relations allow a straightforward specification of the thermal gain at the design stage, which affects sensor sensitivity. Further derived current-to-temperature mapping expresses a temperature estimate based on the measured PTAT output current. Numerical examples indicate attainable estimation accuracy of 0.43% in case of a measurement instance taken in the absence of measurement noise.
Original language | English |
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Article number | 6397587 |
Pages (from-to) | 262-274 |
Number of pages | 13 |
Journal | IEEE Transactions on Components, Packaging and Manufacturing Technology |
Volume | 3 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2013 |
Externally published | Yes |
Keywords
- Bi-complementary metal-oxide-semiconductor (BiCMOS) integrated circuits
- bipolar transistors
- heterojunction
- temperature measurement
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering