Abstract
This article describes the focused ion beam (FIB)-tomography as a high-resolution three-dimensional (3D) technique to study the morphology of polymer/clay nanocomposites. To establish the structure-property relationship of such composite material, it is very important to visualize the 3D-structure and distribution of clay particles in the polymer matrix. The sequential two-dimensional sectioning by FIB, followed by imaging of dispersed silicate layers using high-resolution scanning electron microscope, and computer reconstruction can show the degree of dispersion of silicate layers in 3D-space.
Original language | English |
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Pages (from-to) | 3966-3970 |
Number of pages | 5 |
Journal | Polymer |
Volume | 51 |
Issue number | 17 |
DOIs | |
Publication status | Published - Aug 2010 |
Externally published | Yes |
Keywords
- FIB-tomography
- Microstructure
- Nanocomposite
ASJC Scopus subject areas
- Organic Chemistry
- Polymers and Plastics
- Materials Chemistry