TY - GEN
T1 - A Cost-Effective Low-Voltage Moulded-Case Circuit Breaker Test Jig
AU - Venter, Johan
AU - Van Niekerk, Daniel Rodrigues
N1 - Publisher Copyright:
© 2019 Chamber of Turkish Electrical Engineers.
PY - 2019/11
Y1 - 2019/11
N2 - A practical method to test post-manufactured mechanical thermal and thermal-magnetic low voltage Moulded Case Circuit Breakers (MCCBs) is presented in this paper. Many standards pertaining to the ratings of low voltage MCCBs exist, but little literature exists on how to verify its specified rating post-manufacturing. In this work, a variable voltage over fixed cable and MCCB switch contact resistance test method is used to verify ratings. This method uses two variable transformers driven by two separate stepper motors controlled by a microcontroller with a final step-down toroid transformer. To measure the circuit breaker, trip current level an accurate Hall-Effect current sensor was used and the trip time is determined by a microcontroller-based peripheral timer. Testing was conducted on four different types of circuit breakers, namely: C6, D10, C16, and C20 in order to verify the test jig functionality with good results.
AB - A practical method to test post-manufactured mechanical thermal and thermal-magnetic low voltage Moulded Case Circuit Breakers (MCCBs) is presented in this paper. Many standards pertaining to the ratings of low voltage MCCBs exist, but little literature exists on how to verify its specified rating post-manufacturing. In this work, a variable voltage over fixed cable and MCCB switch contact resistance test method is used to verify ratings. This method uses two variable transformers driven by two separate stepper motors controlled by a microcontroller with a final step-down toroid transformer. To measure the circuit breaker, trip current level an accurate Hall-Effect current sensor was used and the trip time is determined by a microcontroller-based peripheral timer. Testing was conducted on four different types of circuit breakers, namely: C6, D10, C16, and C20 in order to verify the test jig functionality with good results.
UR - http://www.scopus.com/inward/record.url?scp=85080965609&partnerID=8YFLogxK
U2 - 10.23919/ELECO47770.2019.8990527
DO - 10.23919/ELECO47770.2019.8990527
M3 - Conference contribution
AN - SCOPUS:85080965609
T3 - ELECO 2019 - 11th International Conference on Electrical and Electronics Engineering
SP - 121
EP - 125
BT - ELECO 2019 - 11th International Conference on Electrical and Electronics Engineering
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Electrical and Electronics Engineering, ELECO 2019
Y2 - 28 November 2019 through 30 November 2019
ER -