A 2.5 GHz low phase noise silicon germanium heterojunction bipolar transistor ring oscillator

Sarel Johannes Lodiwikus Jean Van Niekerk, Saurabh Sinha

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

This paper presents the modelling of phase noise for a two-stage single-ended silicon germanium (SiGe) heterojunction bipolar transistor-based ring oscillator using the impulse sensitivity function. It is shown that the lower flicker noise characteristic of the SiGe technology at low frequencies translates into low-frequency phase noise improvements. The ring oscillator has a computed phase noise of-80 dBc/Hz at 1 MHz offset for a 2.5 GHz signal. The figure of merit obtained for this oscillator is-142 dBc/Hz.

Original languageEnglish
Title of host publication2016 39th International Semiconductor Conference, CAS 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages137-140
Number of pages4
ISBN (Electronic)9781509012077
DOIs
Publication statusPublished - 14 Dec 2016
Event39th International Semiconductor Conference, CAS 2016 - Sinaia, Romania
Duration: 10 Oct 201612 Oct 2016

Publication series

NameProceedings of the International Semiconductor Conference, CAS
Volume2016-December

Conference

Conference39th International Semiconductor Conference, CAS 2016
Country/TerritoryRomania
CitySinaia
Period10/10/1612/10/16

Keywords

  • SiGe heterojunction bipolar transistor
  • phase noise
  • ring oscillator
  • single-ended

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Fingerprint

Dive into the research topics of 'A 2.5 GHz low phase noise silicon germanium heterojunction bipolar transistor ring oscillator'. Together they form a unique fingerprint.

Cite this