Keyphrases
Pixel Structure
58%
Pixel Circuit
58%
Integrated Circuit Technology
58%
Circuit Optimization
58%
STEM Projects
29%
Microelectronic Sensors
29%
Circuit Breaker
29%
Community Engagement
29%
Sensor Characterization
29%
Imaging Applications
29%
Semiconductor Heterojunction
29%
Reflection-type Phase Shifter
29%
Line Crossings
29%
Back-end-of-line
29%
Coupled-line Couplers
29%
Coupled Line
29%
Space Application
29%
Interdigital Filter
29%
Short Channel
29%
Infrared Detection
29%
Parameter Representation
29%
Process Independent
29%
Sensitivity Enhancement
29%
Near-infrared Detector
29%
Transmission Line Characteristics
29%
Variable Gain
29%
Gain-phase Errors
29%
Frequency Selective
29%
W-band
29%
Slow-wave Transmission Lines
29%
Transistor
29%
Charge-coupled Device
29%
Oscillation Test
29%
Robotics Challenge
29%
Dynamic Sensitivity
29%
Dynamic Range Reduction
29%
Molded Case Circuit Breaker
29%
Passive RF
29%
Zener Diode
29%
Single Junction
29%
Thermal Converter
29%
RF Phase Shifter
29%
Capacitance Analysis
29%
Negative Capacitance
29%
Transient Voltage Suppressor
29%
Diode-connected MOSFET
29%
Capacitance Behavior
29%
Available Si
29%
Floating Base
22%
5 GHz Band
22%
Engineering
Bipolar Transistor
100%
Integrated Circuit
95%
Heterojunctions
64%
Circuit Breaker
58%
Complementary Metal-Oxide-Semiconductor
58%
Simulation Result
44%
Metal-Oxide-Semiconductor Field-Effect Transistor
41%
Microelectronics
29%
Side Wall
29%
Dynamic Range
29%
Noise Performance
29%
Charge-Coupled Device
29%
Flicker Noise
29%
Frequency Noise
29%
Performance Analysis
29%
Fill Factor
29%
W-Band
29%
Channel Device
29%
Independent Parameter
29%
Cross Section
29%
Additive Manufacturing
29%
Space Application
29%
Zener Diode
29%
Thermal Noise
29%
Thermal Converter
29%
Mathematical Model
29%
Reliability Analysis
29%
Transients
29%
Direct Current
29%
Switching Surge
29%
Depletion Region
14%
Noise Voltage
14%
Passivation
14%
Dependent Process
14%
Series Resistance
14%
Ac Performance
14%
V-Band
14%
Point Temperature
13%
Room Temperature
13%
Switching Speed
11%
Cryogenic Temperature
11%
Current-Voltage Characteristic
11%
Microcontroller
9%
Loaded Line
9%
Input Resistance
9%
Power Level
9%
Eigenmode
7%
Process Parameter
7%
Detector Array
7%
Measured Parameter
7%