Jeol 733 Superprobe

Facility/equipment: Equipment

    Equipments Details


    The JEOL 733 is also equipped for both wavelength dispersive and energy dispersive analyses. It allows simultaneous EDS/WDS analysis. In addition to element maps of a specimen, images from secondary electrons (SEI) and back-scattered electrons (BSE) can be produced. Our suite of available standards is comprehensive and diverse.

    Equipped with:

    Secondary-electron detector.
    Backscattered-electron detector.
    Energy-dispersive spectrometer (Si(Li)).
    Wavelength-dispersive spectrometer (IbeX).
    ThermoNORAN VANTAGE software, including beam current measurement and automation.

    Applications at SPECTRAU:

    Imaging and X-ray microanalysis of inorganic solids..
    Imaging of biological specimen.


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