Equipments Details
Description
The JEOL 733 is also equipped for both wavelength dispersive and energy dispersive analyses. It allows simultaneous EDS/WDS analysis. In addition to element maps of a specimen, images from secondary electrons (SEI) and back-scattered electrons (BSE) can be produced. Our suite of available standards is comprehensive and diverse.
Equipped with:
Secondary-electron detector.
Backscattered-electron detector.
Energy-dispersive spectrometer (Si(Li)).
Wavelength-dispersive spectrometer (IbeX).
ThermoNORAN VANTAGE software, including beam current measurement and automation.
Applications at SPECTRAU:
Imaging and X-ray microanalysis of inorganic solids..
Imaging of biological specimen.
Equipped with:
Secondary-electron detector.
Backscattered-electron detector.
Energy-dispersive spectrometer (Si(Li)).
Wavelength-dispersive spectrometer (IbeX).
ThermoNORAN VANTAGE software, including beam current measurement and automation.
Applications at SPECTRAU:
Imaging and X-ray microanalysis of inorganic solids..
Imaging of biological specimen.
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